The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2002
Filed:
May. 14, 1999
Mohamed Ahmed Ali, Niskayuna, NY (US);
Bharat Sampathkumaran Bagepalli, Niskayuna, NY (US);
Bijan Dorri, Clifton Park, NY (US);
Thomas Gerard Ebben, Sullivan, WI (US);
Aniruddha Dattatraya Gadre, Niskayuna, NY (US);
Michael Solomon Idelchik, Mequon, WI (US);
Khan Mohamed Khirullah Genghis Khan, Niskayuna, NY (US);
Brian Douglas Lounsberry, Thiensville, WI (US);
Arlie Russell Martin, Ballston Spa, NY (US);
Thomas Frederick Papallo, Jr., Farmington, CT (US);
Mark Alan Preston, Niskayuna, NY (US);
Raymond Kelsey Seymour, Plainville, CT (US);
Douglas J. Snyder, Brookfield, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
An exemplary embodiment of the invention is directed to a method for performing quality function deployment for a system having a plurality of levels. The method includes obtaining a plurality of first level critical to quality parameters and obtaining a plurality of first level key control parameters. A first level quality matrix is generated identifying an effect at least one first level key control parameter has on at least one first level critical to quality parameter. The first level key control parameters are arranged into a first group and a second group. A second level quality matrix is generated for the first group. The second level quality matrix includes second level critical to quality parameters corresponding to the first group of first level key control parameters and a second level key control parameter. The second level quality matrix identifies an effect said second level key control parameter has on at least one second level critical to quality parameter.