The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2002

Filed:

Jul. 07, 2000
Applicant:
Inventors:

Shankar Visvanathan Guru, Schenectady, NY (US);

Peter Michael Edic, Schenectady, NY (US);

Allan John Connolly, Albany, NY (US);

Harry Kirk Mathews, Jr., Clifton Park, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G 1/08 ;
U.S. Cl.
CPC ...
H05G 1/08 ;
Abstract

In predicting failure of an x-ray tube in a computed tomography (CT) system, reference detector elements normally disposed on each end of the detector, receive x-rays directly from the x-ray tube. In accordance with the invention, the output values of the reference detector elements are utilized by a tube condition prediction algorithm to predict a failure in the x-ray tube of the CT system. The tube condition prediction algorithm utilizes at least one model of the CT system and at least one prediction routine, which typically is a Kalman filter, to generate the prediction. The prediction routine uses the model to analyze the output values of the reference detector elements in order to determine the condition of the x-ray tube and predict future performance of the x-ray tube.


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