The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2002

Filed:

Aug. 31, 1998
Applicant:
Inventors:

Jimmie D. Felps, Colorado Springs, CO (US);

Brian L. Richardson, late of Port Richey, FL (US);

Gerald R. Kinsley, Colorado Springs, CO (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/102 ;
U.S. Cl.
CPC ...
G01R 3/102 ;
Abstract

An electrical probe is provided for use with an electrical instrument, such as an oscilloscope. The probe includes a probe body, a sensing element affixed to the probe body for sensing an electrical parameter and a storage device containing probe information that uniquely identifies the probe. The probe information is electronically transferred from the storage device to the electrical instrument when the probe is connected to the electrical instrument. The electrical instrument stores calibration information that is associated with the probe. The electrical instrument uses the probe information received from the storage device in the probe to access the associated calibration information. The accessed calibration information is used to calibrate measurements made with the probe.


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