The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2002
Filed:
Jul. 13, 1999
Applicant:
Inventors:
Takao Fukuoka, Kyoto, JP;
Akio Okubo, Kyoto, JP;
Assignee:
Kyoto Daiichi Kagaku Co., Ltd., Kyoto-fu, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/348 ;
U.S. Cl.
CPC ...
G01N 3/348 ;
Abstract
A device for assay of a liquid sample. The device comprises: a support composed of an organic macromolecule, said support having a surface divided into two areas located adjacent to each other; a divider in the surface, defining the border of both areas to separate a first area from a second area; a detection layer affixed to the first area and containing a reagent; and a water-swelling layer affixed to the second area, said water-swelling layer expanding by absorbing water.
Fukuoka, Takao. (2002). Method of manufacturing a device for assay of liquid sample (U.S. Patent No. 6350616). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6350616
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile