The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 26, 2002

Filed:

Feb. 14, 2000
Applicant:
Inventors:

Neel K. Mani, Stow, OH (US);

Vladimir Roth, Akron, OH (US);

S. J. Olesky, Akron, OH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/902 ;
U.S. Cl.
CPC ...
G01N 1/902 ;
Abstract

A friction testing machine and method for measuring friction characteristics between a test sample and a friction surface. The machine and method are particularly suited for measuring the coefficient of friction between a rubber specimen or a tread element and different friction surfaces at different sliding velocities, contact pressures and orientations. The machine includes a carriage, a friction surface, a motion device, a sample holder, a variable weight loading device, and a force measurement device. The motion device to cause relative movement between the carriage and the friction surface in forward and reverse directions and the sample holder holds a sample in frictional engagement with the friction surface during this forward and reverse movement. The variable weight loading device loads the sample holder so that a selected load can be applied to the sample in a direction normal to the friction surface. The force measurement device obtains a measurement indicative of the frictional force resisting movement of the sample as it is moved in the forward and reverse directions. The processor controls the motion device, controls the variable weight loading device and/or records the measurements obtained by the force measurement device.


Find Patent Forward Citations

Loading…