The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2002

Filed:

Dec. 04, 1998
Applicant:
Inventors:

Zhen-Liang Shi, Germantown, MD (US);

Yezdi Antia, Gaithersburg, MD (US);

A. Roger Hammons, Jr., North Potomac, MD (US);

Assignee:

Hughes Electronics Corporation, El Segundo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 2/706 ;
U.S. Cl.
CPC ...
H04L 2/706 ;
Abstract

A method for improving spectral sampling using Discrete Fourier Transforms in a processor to detect a continuous wave (CW) signal in a burst having large initial uncertainties comprises the steps of dividing the burst into smaller sub-bursts; performing a Discrete Fourier Transform on each sub-burst; and non-coherently combining each sub-burst. A further variation includes selecting an optimal number L of sub-bursts based upon system performance, and desired detection performance at a minimum operating signal to noise ratio.


Find Patent Forward Citations

Shi, Zhen-Liang. (2002). Method for improving spectral sampling using sub-burst discreet fourier transforms (U.S. Patent No. 6349120). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6349120

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…