The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 19, 2002
Filed:
Jan. 19, 1999
Applicant:
Inventor:
John F. Walsh, Rochester, NY (US);
Assignee:
Xerox Corporation, Stamford, CT (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 1/04 ;
U.S. Cl.
CPC ...
H04N 1/04 ;
Abstract
A multi-scanning system or image processing system includes a plurality of sensors, each of the sensors scanning a portion of the document to produce image data. Each of the sensors overlaps adjacent ones of the sensors so that the image data includes overlapped image data. The image data from the sensors is stitched together to form a complete image. The stitching may be performed by a weighted averaging of the data or by varying stitch location within the data. This stitching is useful in eliminating visible image defects created the misalignment of pixels between adjacent sensors.