The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2002

Filed:

Sep. 23, 1999
Applicant:
Inventors:

David A. Purcell, San Diego, CA (US);

David A. Neese, Escondido, CA (US);

Warren Free, Anaheim, CA (US);

Assignee:

Encad, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 2/9393 ;
U.S. Cl.
CPC ...
B41J 2/9393 ;
Abstract

A droplet deposition analysis system for an ink jet printer including a flexible transparent substrate. The printer may include a light source on one side of the substrate, and an optical detector on the other side of the substrate.


Find Patent Forward Citations

Purcell, David. (2002). Ink droplet analysis apparatus (U.S. Patent No. 6347857). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6347857

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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