The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2002
Filed:
Jan. 14, 2000
Yong-Hoon Kang, Kyungsangbuk-do, KR;
Byung-Jik Kim, Seoul, KR;
SamSung Electronics Co., Ltd., Suwon, KR;
Abstract
An apparatus and method of monitoring multiple channel signals of a wavelength division multiplexing (WDM) signal in a WDM system. The optical signal monitoring apparatus includes: an optical demultiplexer having 2N+2 output ports, for receiving and demultiplexing by wavelength a wavelength division multiplexing (WDM) signal with N wavelengths, and outputting two output port signals for each channel via the 2N output ports and outputting two adjacent signals via the +2 output ports needed to measure the optical signal noise ratio outside the frequency range of the WDM signal; a signal conversion unit for receiving the output port signals from the optical demultiplexer and converting the received optical output port signals into digital signals; and a signal processing unit for receiving the digital signals and calculating the wavelength and optical power for each channel using the loss characteristics of the two output port signals of each channel. Therefore, the information about the multiple channel signals, such as the optical power, the wavelength and the optical signal to noise ratio (OSNR), can be simultaneously and accurately obtained by using the optical signal monitoring apparatus constructed as a small module.
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