The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2002
Filed:
May. 26, 1999
Martin Annis, Cambridge, MA (US);
AnnisTech, Inc., Cambridge, MA (US);
Abstract
An x-ray inspection system for automatically detecting nuclear weapons materials generates a high energy x-ray fan beam or a traveling x-ray pencil beam that traverses an object under inspection. An x-ray detector detects x-ray energy that passes through the object and provides a detected signal indicative thereof. The detected signal is processed to detect the presence of an area of very high x-ray attenuation within the object under inspection, which is indicative of nuclear weapons materials. Because of the high atomic number (Z) and high density of nuclear weapons materials Uranium and Plutonium, both of these materials attenuate (i.e., absorb) incident x-rays significantly more than ordinary materials. That is, very high Z materials such as nuclear weapons materials, produce no x-rays outside of their block of material because the x-rays are self absorbed within the very high Z materials. Therefore, these materials can be detected by a transmission detectors, or by combining the readings from transmission and scatter detectors, if a pencil beam system is employed.