The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 12, 2002
Filed:
Jan. 14, 2000
Noriyuki Toriyama, Tokyo, JP;
Tadao Nagatsuma, Sagamihara, JP;
Mitsuru Shinagawa, Isehara, JP;
Junzo Yamada, Ebina, JP;
Other;
Abstract
An electro-optic sampling probe used for observing a waveform of a test signal based on the change of the polarization state of a light pulse caused when the light pulse generated based on a timing signal is entered in an electro-optic crystal that is coupled by an electric field generated by the test signal. The electro-optic sampling probe includes an electro-optic crystal having a stopper portion at its upper portion, an electro-optic crystal supporting portion for supporting the electro-optic crystal by the stopper portion so as not to fall and capable of moving the electro-optic crystal vertically and an electro-optic crystal driving portion formed by a base and a board, to which the electro-optic crystal supporting portion is attached which moves on the base, for rectilinearly moving the electro-optic crystal along the direction of an optical axis.