The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2002

Filed:

Feb. 24, 1999
Applicant:
Inventors:

Yuichi Arita, Kawasaki, JP;

Naoyuki Nozaki, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 1/510 ;
U.S. Cl.
CPC ...
G06T 1/510 ;
Abstract

The present invention provides an interference check result displaying method, by which a rough position and a precise position of a representative point at which contact or interference occurs between objects present in a virtual three-dimensional space. Consequently, not only a rough position but also a precise position of a representative point at which contact or interference occurs can be recognized readily. Further, also in a case wherein such a real time performance as to perform an interference check while an object is moved or rotated, a rough position and a precise position of a representative point at which contact/interference occurs can be recognized similarly readily. Also where a plurality of representative points are present, a designated representative point can be identified readily from other representative points, and also representative points which are hidden by different objects can be recognized readily.


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