The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2002

Filed:

Jun. 04, 1999
Applicant:
Inventors:

Ramachandra Divakaruni, Middletown, NY (US);

Mary E. Weybright, Pleasant Valley, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/976 ;
U.S. Cl.
CPC ...
H01L 2/976 ;
Abstract

A semiconductor device includes a semiconductor substrate having an oxide layer thereon. A gate conductor is provided on the oxide layer, the gate conductor including a layer of polysilicon on the oxide layer, a tungsten silicide layer on the polysilicon layer, and a nitride cap layer on the tungsten silicide layer. The polysilicon layer has a length greater than length of the silicide layer and the nitride layer. Dielectric spacers on the gate conductor overlay the nitride cap layer and the tungsten silicide layer to provide a sidewall substantially flush with the polysilicon layer. Exposed polysilicon on the polysilicon layer is oxidized.


Find Patent Forward Citations

Divakaruni, Ramachandra. (2002). Modified gate conductor processing for poly length control in high density drams (U.S. Patent No. 6346734). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6346734

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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