The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 12, 2002

Filed:

Feb. 03, 2000
Applicant:
Inventors:

Rick M Tanaka, Vancouver, WA (US);

Brent A Geske, Vancouver, WA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 2/01 ;
U.S. Cl.
CPC ...
B41J 2/01 ;
Abstract

A method and apparatus for automatic alignment of ink-jet printheads includes fitting measuring constructs to actual print data acquired form a print made using a given, predetermined, test pattern data set. Specific test patterns for use in automated alignment of ink-jet printheads are suited to providing a variety of printhead alignment information in a compact format. The test pattern data set location finding algorithm incorporates techniques for avoiding carriage-induced dynamic errors during automated alignment of ink-jet printheads.


Find Patent Forward Citations

Tanaka, Rick. (2002). Peak-valley finder process for scanned optical relative displacement measurements (U.S. Patent No. 6345876). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6345876

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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