The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2002
Filed:
May. 05, 1999
Applicant:
Inventor:
Ian Lam, Fremont, CA (US);
Assignee:
Advanced Micro Devices Inc., Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 2/900 ; G01R 3/128 ; G06F 1/100 ; G06F 1/110 ;
U.S. Cl.
CPC ...
G11C 2/900 ; G01R 3/128 ; G06F 1/100 ; G06F 1/110 ;
Abstract
A method and apparatus are disclosed for testing the functionality of a queue structure. An input circuit is provided for inputting data into an input portion of the queue structure, while an output circuit is provided for retrieving data from an output portion of the queue structure. A comparison logic circuit compares the retrieved data with the input data to determine the integrity of the data that was stored in the queue structure and verify that the data from the output portion is identical to the data input to the queue. Various embodiments are disclosed for testing queue structure both in real time and in a test mode.