The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2002

Filed:

Jan. 04, 2000
Applicant:
Inventors:

Peter Ramm, St. Catharines, CA;

Gang Sun, St. Catharines, CA;

Assignee:

Imaging Research, Inc., St. Catharines, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

A method and apparatus are disclosed for use in an area digital imaging system for assays to extract targets on a specimen containing an array of targets that may not be arranged in perfect regularity. A matrix is defined of nominal target locations including a probe template of predefined, two-dimensional size and shape at each of a plurality of fixed, predefined grid points on the specimen, and a determination is made of the most probable location of the probe template corresponding to a specific target by sensing both pixel intensity and the spatial distribution of pixel intensities in an image of the specimen at a plurality of locations in the vicinity of a nominal target location.


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