The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2002
Filed:
Jul. 21, 2000
Ian Hopkins, Houghton-on-the-Hill, GB;
Keith Hall, Thurcaston, GB;
Anthony Smith, Carlton, GB;
Dipak Daudia, Humberstone, GB;
Taylor Hobson Limited, , GB;
Abstract
A metrological instrument for measuring surface characteristics such as surface form of a component ( ). The instrument includes a slideway ( ) to cause relative movement between a surface sensing probe ( ) and the component which allows the probe to traverse a surface of the component. A probe carriage ( ) supports the probe to allow the probe to move as a body in a measurement direction relative to the carriage so as to follow a surface being sensed. An optical sensor ( ) provides a signal indicative of the displacement of the probe relative to the probe carriage. A controller ( ) acts in response to a signal from the optical sensor, to move the probe carriage so as to maintain the probe in an operational range. A further sensor ( ) measures measurement of displacement of the probe in the measurement direction as it follows a surface during use of the instrument.