The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2002

Filed:

Oct. 05, 1999
Applicant:
Inventor:

Peter Mok, San Francisco, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B24B 1/00 ;
U.S. Cl.
CPC ...
B24B 1/00 ;
Abstract

A method and apparatus provide polishing of a semiconductor wafer or other substrate. The apparatus includes multiple wafer carriers provided on the top surface of a table. A semiconductor wafer is seated face-up in the wafer carrier. Each wafer carrier is driven by an electric motor to rotate at a low speed. During operation, each wafer carrier is positioned at a work station where a specified task is performed. The table rotates when the task at each station is completed to move the wafers from station to station. Thus multiple tasks relating to polishing (e.g., buffing and drying) can be carried out in parallel. At one station, a polishing pad is positioned by a polishing pad carrier face-down to polish the surface of the semiconductor wafer. A motor drives the polishing pad to move in a high-speed circular motion.


Find Patent Forward Citations

Loading…