The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2002
Filed:
Jul. 14, 2000
William T. Yost, Newport News, VA (US);
John H. Cantrell, Williamsburg, VA (US);
Abstract
An acoustic non-linearity parameter (&bgr;) measurement method and system for Non-Destructive Evaluation (NDE) of materials and structural members obviates the need for electronic calibration of the measuring equipment. Unlike known substitutional measuring techniques requiring elaborate calibration procedures, the electrical outputs of the capacitive detector of a sample with known &bgr; and the test sample of unknown &bgr; are compared to determine the unknown &bgr;. In order to provide the necessary stability of the present-inventive reference-based approach, the bandpass filters of the measurement system are maintained in a temperature-controlled environment, and the line voltage supplied to said amplifiers is well-regulated.