The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 05, 2002
Filed:
Mar. 08, 2000
Olivier Reglat, Montreal, CA;
Philippe A. Tanguy, Montreal, CA;
Polyvalor S.E.C., , CA;
Abstract
The system and the method are used to determine the process viscosity (&mgr;) of a fluid ( ) in a film metering device ( ) used to form a film ( ) to be applied on a substrate ( ), such as a paper web or any other suitable flexible materials. The apparent shear rate ({dot over (&ggr;)}) of the fluid, indicative of the flow field, may also be calculated. These parameters are calculated using a pressure profile representing the pressure of the fluid between a transfer roll ( ) and a metering rod ( ) which controls the thickness of the coating film ( ). The torque (T) applied on the metering rod ( ) is also measured and taken into account in the calculations. The system and method allow the process viscosity (&mgr;) to be easily and accurately determined during the operation of the film metering device ( ) without the need of testing the fluid in an external device and attempting to extrapolate the results to the process.