The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2002

Filed:

Mar. 12, 1999
Applicant:
Inventors:

Lev Finkelstein, Netanya, IL;

Andrei Heilper, Haifa, IL;

Eugene Wallach, Haifa, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 ;
U.S. Cl.
CPC ...
G06K 9/00 ;
Abstract

A method for locating a structured field in a gray-scale image of an object, including choosing a plurality of anchor points in the image, each anchor point having a gray-scale value associated therewith. For each anchor point there is determined a horizontal variation dependent on a difference between the gray-scale value of the anchor point and the gray-scale value of a horizontally neighboring anchor point, and there is also determined a vertical variation dependent on a difference between the gray-scale value of the anchor point and the gray-scale value of a vertically neighboring anchor point. Those anchor points whose vertical and horizontal variations obey a first or a second predefined condition are defined as vertically or horizontally dominant respectively. One or more kernels are defined in the image, each such kernel comprising a group of anchor points n predetermined mutual proximity and satisfying a third predefined condition relating the number of vertically-dominant and horizontally-dominant anchor points in the group. The structured field in the image is located using one or more kernels.


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