The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 29, 2002

Filed:

Aug. 26, 1998
Applicant:
Inventors:

Allan Harvey Dansky, Poughkeepsie, NY (US);

Alina Deutsch, Chappaqua, NY (US);

Gerard Vincent Kopcsay, Yorktown Heights, NY (US);

Phillip John Restle, Katonah, NY (US);

Howard Harold Smith, Beacon, NY (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01P 5/00 ; H01P 1/00 ;
U.S. Cl.
CPC ...
H01P 5/00 ; H01P 1/00 ;
Abstract

A method and system for reducing the computation complexity and improving accuracy of delay and crosstalk calculation in transmission-lines with frequency-dependent losses. An analysis tool based on restricted coupled-line topologies, simple two-dimensional to three-dimensional RLC matrix conversion, and use of prestored synthesized circuits that accurately capture frequency-dependent loss effects. The CAD tool can handle frequency-dependent resistive and inductive effects for coupled-interconnections on large microprocessor chips with >10K of critical nets. This is done in an interactive manner during the design cycle and allows first path fast product design.


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