The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2002
Filed:
Mar. 15, 2000
Masahiko Inoue, Chiyoda, JP;
Toshihiko Horiuchi, Ushiku, JP;
Yasuyuki Momoi, Ushiku, JP;
Takao Konno, Minori, JP;
Wataru Yamagishi, Abiko, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A shaking response is estimated with high precision by performing a shaking test f or combining and estimating a shaking characteristic of a partial structure of an object under test obtained through a shaking test and a shaking response of the whole structure which is numerically modeled. In a shaking test apparatus and method, a structure under test comprises a partial structure and a numerical model which is virtually connected to the partial structure. First, a vibration model corresponding to the partial structure is assumed, the numerical model and the vibration model are combined to construct an overall-system model, and then the vibration response of the overall-system model is calculated. On the basis of the calculation result and the signal input from a waveform oscillator, the partial structure is shaken by using a shaker. The displacement and reaction force of the partial structure are measured by a displacement gauge and a load cell, the vibration model is corrected on the basis of the measurement value and the overall-system model is reconstructed. This procedure is repeated to construct the overall-system model with high precision.