The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 22, 2002
Filed:
Dec. 16, 1997
Francois Ducaroir, Santa Clara, CA (US);
Karl S. Nakamura, Palo Alto, CA (US);
Michael O. Jenkins, San Jose, CA (US);
LSI Logic Corporation, Milpitas, CA (US);
Abstract
A serial data transceiver is presented which includes elements which facilitate testing using only the serial data transfer terminals of the transceiver. The serial data transceiver includes a transmitter and a receiver. The transmitter receives parallel data, converts the parallel data to a serial data stream, and transmits the serial data stream. The receiver receives a serial data stream, converts the serial data stream to parallel data, and provides the parallel data. During testing, parallel data produced by the receiver is routed to the transmitter input. In one embodiment, the transmitter includes a first router for routing parallel input data to the transmitter, and the receiver includes a second router for routing parallel output data produced by the receiver. The first router is coupled to the second router, both routers receive a test signal. When the test signal is asserted, the second router routes the parallel output data produced by the receiver to the first router, and the first router routes the parallel output data produced by the receiver to the transmitter. As a result, the received serial data is retransmitted by the transceiver. A test method involves asserting the test signal, providing serial input test data to a serial data input port, receiving serial output test data from a serial data output port, and comparing the serial output test data to the serial input test data. A match between the serial output test data and the serial input test data verifies proper operation of the serial data transceiver.