The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2002

Filed:

Feb. 03, 2000
Applicant:
Inventor:

Kinji Kayanuma, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/00 ;
U.S. Cl.
CPC ...
G11B 7/00 ;
Abstract

A method of replacement processing for secondary defects is provided that can maintain both the transfer rate and quality of write/read data at high levels. According to the method, a change-permitted range in which changes in the assignment of logical addresses is allowed is acquired, and when sectors having secondary defects due to write abnormalities are detected, replacement of sectors is carried out as long as changes in the assignment of logical addresses do not go beyond sectors in the change-permitted range by: omitting the secondary defect sectors by additionally registering the defective sectors in a slip replacement list, and shifting back the assignment of logical addresses as long as there are free sectors following the abnormal sectors.


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