The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2002

Filed:

Aug. 03, 2000
Applicant:
Inventors:

Marilyn Wolfson, Acton, MA (US);

Barbara Forman, Framingham, MA (US);

Robert Hallowell, Nashua, NH (US);

Michael Moore, Bedford, MA (US);

James Wilson, Boulder, CO (US);

Sandra Henry, Denver, CO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 1/395 ;
U.S. Cl.
CPC ...
G01S 1/395 ;
Abstract

A method and apparatus for determining the predictability of an element in a weather radar image. An image filter approximating the envelope of the organized storm radar image is applied to a pixel in a received weather radar image to generate a processed pixel value. A variability value is determined from the variation in the pixel values of the neighboring pixels which lie within the image filter. The predictability is generated from the processed pixel value and the variability. Pixels having high processed pixel values and low variabilities typically correspond to pixels within a strong organized storm and, therefore, are more predictable. Pixels having low processed pixel values and high variabilities, such as pixels representative of airmass storms, generally have lower predictabilities.


Find Patent Forward Citations

Wolfson, Marilyn. (2002). Method for determining storm predictability (U.S. Patent No. 6340946). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6340946

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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