The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2002

Filed:

Oct. 03, 2000
Applicant:
Inventors:

David C. Schwartz, New York, NY (US);

Bhubaneswar Mishra, Great Neck, NY (US);

Thomas S. Anantharaman, Carmel, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/00 ; C12Q 1/68 ; C12P 2/106 ; C12P 1/00 ; G01N 2/100 ;
U.S. Cl.
CPC ...
C12Q 1/00 ; C12Q 1/68 ; C12P 2/106 ; C12P 1/00 ; G01N 2/100 ;
Abstract

A method of producing high-resolution, high-accuracy ordered restriction maps based on data created from the images of populations of individual DNA molecules (clones) digested by restriction enzymes. Detailed modeling and a statistical algorithm, along with an interactive algorithm based on dynamic programming and a heuristic method employing branch-and-bound procedures, are used to find the most likely true restriction map, based on experimental data.


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Schwartz, David. (2002). Genomics via optical mapping with ordered restriction maps (U.S. Patent No. 6340567). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6340567

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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