The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 22, 2002

Filed:

Mar. 11, 1999
Applicant:
Inventor:

Shingo Ogawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01R 1/324 ;
U.S. Cl.
CPC ...
H01R 1/324 ;
Abstract

Disclosed are an improved probe pin assembly and a method of making the same. Each probe pin uses a sleeve which is formed by stamping and deep-drawing a thin sheet of metal with dies. The sleeve has a contact pin slidably fitted therein, a resilient member contained therein to spring-bias the contact pin with its tip end appearing from the sleeve and a cover plate fastened to and closing the rear opening of the sleeve.


Find Patent Forward Citations

Ogawa, Shingo. (2002). Probe pin assembly, a method of making the same and a connector using the same (U.S. Patent No. 6340320). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6340320

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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