The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2002
Filed:
Mar. 31, 1999
Yuanping Zhao, San Jose, CA (US);
LSI Logic Corporation, Milpitas, CA (US);
Abstract
An optical-disk play-back system has a lens that receives a light beam reflected from a data surface of an optical disk. The lens focuses the light on four quadrant photodiodes. The position of the lens relative to the photodiodes is adjusted by a standard tracking control loop. In addition, the sledge position is controlled by a sledge-center-error signal. Since the sledge position changes only infrequently, the center error is a low-frequency signal. A non-linear center-error-generating circuit uses two op-amp stages. Signals from an inner pair of photodiodes are summed and applied to one input of the first-stage op amp, while signals from an outer pair of photodiodes are summed and applied to the other input of the first-stage op amp. The first-stage op amp output an overall error signal that includes high-frequency errors. A high-pass filter removes low-frequency components output from the first-stage op amp. The high-pass filter drives an inverting input of the second-stage op amp. The non-inverting input of the second-stage op amp receives the unfiltered output of the first-stage op amp. The second-stage op amp suppresses the high-frequency components from the overall error signal, producing a low-frequency center-error signal.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile