Content-addressable memory for virtual ground flash architectures

Abstract

Five architectures for the implementation of virtual ground non-volatile content-addressable memory are provided. Three of the architectures are applicable to 2-bit non-volatile memory transistors having separate programming capability for two current directions (i.e., drain-to-source and source-to-drain. Another architecture is applicable to any floating gate memory transistor, including 1-bit and 2-bit non-volatile memory transistors. In general, an array of non-volatile memory transistors is arranged in a plurality of horizontal rows and vertical columns. Words are stored in selected columns of the array. Horizontal compare lines are coupled to receive a comparand word, with each compare line being coupled to the gates of the memory transistors in a row of the array. The vertically aligned source/drain regions of the memory transistors are coupled to form word lines. Sense amplifiers are coupled to selected word lines. Switches can be coupled to the sense amplifiers and/or word lines, thereby enabling program and compare operations to be performed in two different directions when 2-bit non-volatile memory transistors are used. Compare operations can be performed over two or more phases when 2-bit non-volatile memory transistors are used. Sequential logic circuits can also be coupled to the sense amplifiers, and used to store the results of different compare phases.