The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2002
Filed:
Nov. 02, 1999
Applicant:
Inventors:
Suzanne Wakelin, Mountain View, CA (US);
Matthew W. Derstine, Sunnyvale, CA (US);
James S. Wong, Mountain View, CA (US);
Assignee:
ONI Systems Corp., San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 3/00 ; G02B 2/710 ;
U.S. Cl.
CPC ...
G02B 3/00 ; G02B 2/710 ;
Abstract
Optical systems are corrected for a variety of aberrations by a microlens array where an optical property of the individual microlenses varies as a function of position in the array. For example, the microlenses can be configured so that the focal length varies to correct field curvature. Representative environments for the microlens array may be characterized by a pixellated source (array of individual sources) in an object plane or a pixellated detector (array of individual detectors) in an image plane, or both.