The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2002

Filed:

Aug. 21, 2000
Applicant:
Inventor:

John Francis Gordon, Glasgow, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/100 ; G01N 2/00 ; G01N 2/159 ;
U.S. Cl.
CPC ...
G01N 2/100 ; G01N 2/00 ; G01N 2/159 ;
Abstract

A system for conducting an optical inspection of a biological, chemical, or biochemical sample supported by an optically transparent disc. The disc is mounted for rotation about its central axis while a light source and detector are mounted on an arm for rotation in an arc crossing the surface of the disc. The source is arranged above the disc and the detector is arranged below the disc with the optical axes provided with a calibration marking which interrupts the passage of the light beam when the beam passes over it, thus allowing the scan to be aligned relative to the disc. The optical properties of the sample supported on the substrate can be automatically and rapidly inspected by analyzing the output of the light detector.


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