The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2002
Filed:
Jul. 22, 1999
Mark N Keene, Malvern, GB;
Julian S Satchell, Malvern, GB;
The Secretary of State for Defence, Farnborough, GB;
Abstract
A gradiometer for measuring properties of a magnetic field and in particular, for measuring magnetic field gradient components, comprising at least two magnetic sensors wherein at least two of the magnetic sensors are arranged to sense the magnetic field component in substantially the same direction. The magnetic sensors may be super conducting quantum interference device (SQUID) magnetometers, Hall probes, flux gates or magneto-resistive magnetometers. The gradiometer also includes a computer processor loaded with an adaptive signal-processing algorithm, for performing adaptive signal balancing of the magnetometer outputs. In a preferred embodiment the gradiometer may comprise at least eight magnetometers in a three-dimensional arrangement, and a set of three orthogonal global feedback coils, one for each direction x, y, z, such that the five independent magnetic field gradient components may be measured. The gradiometer may also be used to measure second or higher order magnetic field gradient components.