The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 15, 2002
Filed:
May. 01, 2000
Richard L. Trantow, Cincinnati, OH (US);
General Electric Company, Cincinnati, OH (US);
Abstract
An eddy current inspection probe for inspecting a preselected surface at least partially defining an opening in a component. The eddy current inspection probe includes a core moveable between a retracted position and an expanded position in which the probe is sized and shaped for at least partially filling the opening and contacting the preselected surface for inspecting the surface. The probe includes a compliant covering positioned over the exterior surface of the core and an eddy current array positioned over the outer face of the covering. Further, the probe includes an element positioned between an exterior surface of the core and an inner face of the covering having a coefficient of friction selected to permit the inner face of the covering to move tangentially with respect to the exterior surface of the core as the core is moved from the retracted position to the expanded position to ensure intimate contact between probe and the preselected surface of the component being inspected.