The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 15, 2002

Filed:

Jul. 12, 1999
Applicant:
Inventors:

Takao Tawara, Saitama-ken, JP;

Toshiei Kera, Saitama-ken, JP;

Assignee:

Opticon INC, Orangeburg, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 7/10 ;
U.S. Cl.
CPC ...
G06K 7/10 ;
Abstract

An optical pattern reading apparatus includes a housing with a light projecting means located within the housing for projecting a line of light onto an optical pattern located external to the housing and wherein the line of light is cyclically swept across an optical pattern to be read. A reflecting mirror located in the housing, posteriorly of the light source is moved in synchronism with the line of light projected onto the optical pattern to receive a line of light reflected from the optical pattern and projecting its reflected light via a light receiving and condensing optics assembly onto a linear image sensor. The information present within an area can thus be sensed using a linear image sensor.


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