The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2002

Filed:

Apr. 19, 1999
Applicant:
Inventors:

Russell L. Gillenwater, Round Rock, TX (US);

Philip J. Brisky, Manchaca, TX (US);

Kenneth G. Keels, Austin, TX (US);

Assignee:

Compaq Computer Corporation, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02H 3/05 ; H03K 1/9003 ;
U.S. Cl.
CPC ...
H02H 3/05 ; H03K 1/9003 ;
Abstract

The real-time test controller maintains a failure database containing a history of past failures for devices under test and selectively sorts the history for the device to be tested. The diagnostic testing sequence is then rearranged with tests having higher failure rates being conducted first. If faults are detected, a message is provided to the operator and the failure database is either manually or automatically updated with the latest fault information. In this manner, a continuously updated history of faults is maintained and the most efficient testing sequence is followed, resulting in significant time and cost savings.


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