The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2002
Filed:
Oct. 19, 1998
Harold R. Garner, Flower Mound, TX (US);
Roger A. Schultz, Plano, TX (US);
The University of Texas System Board of Regents, Austin, TX (US);
Abstract
A filter-less imaging microscope and method for analyzing samples on a slide at multiple wavelengths of light comprising, a microscope ( ), a light dispersive element ( ) positioned to receive images from the microscope ( ) at multiple wavelengths, the light dispersive element ( ) producing an array of light from the image and a camera ( ) positioned to detect the light array produced by the light dispersive element ( ), wherein the camera ( ) detects the light array dispersed by the light dispersive element ( ) at multiple wavelengths, is disclosed. The camera ( ) can detect the entire spectrum of light produced by the light dispersive element ( ).