The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 08, 2002

Filed:

Mar. 15, 1999
Applicant:
Inventors:

Henry Pawlowski, Seville, OH (US);

Xiaofeng Xu, Cuyahoga Falls, OH (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/100 ;
U.S. Cl.
CPC ...
G01N 1/100 ;
Abstract

An improved method and apparatus for measuring the properties of thermoset plastics and viscoelastic materials. The present invention includes a seal member which inhibits the release of sample material from the die cavity of a test instrument. As a result, sufficient sample material is maintained within the die cavity when pressure is applied to the material. Accordingly, an appropriate shearing force can be applied to the sample material to obtain torque measurements. Moreover, by inhibiting the release of sample material from the die cavity, sample material is prevented from coming into contact with components of the test instrument outside the die cavity, which in turn may distort or invalidate measurements of torque.


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