The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2002

Filed:

Mar. 26, 1999
Applicant:
Inventors:

Chung-Pang Yu, Yi-Lan Hsien, TW;

Kuo-Ping Liu, Pin-Tung Hsien, TW;

You-Ming Chiu, Hsin Chuang, TW;

Assignee:

Via Technologies Inc., Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G06F 1/100 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G06F 1/100 ;
Abstract

A chip testing system using an internal signal of the chip under test to produce a blanking signal so as to avoid a conflict in the turn-around cycle between input mode and output mode. The preceding signal, posterior signal and reverse phase signal of the output enable signal of the chip under test are used to match with a testing circuit for producing a blanking signal, which is driven only when the output enable signal is at a high potential, enabling the state machine in the chip to control data reading time, so as to avoid a conflict in the turn-around cycle between input mode and output mode.


Find Patent Forward Citations

Loading…