The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2002
Filed:
Nov. 21, 2000
Yutaka Tsuchiya, Hamamatsu, JP;
Hamamatsu Photonics K.K., Shizuoka, JP;
Abstract
A method of measuring an internal property distribution of a scattering medium, comprises a step of injecting rays into a measured medium, a step of detecting rays having passed through the interior of the measured medium, a step of acquiring a measurement value of a predetermined parameter for each of combinations of a light injection position with light detection positions, a step of setting a reference value of an absorption coefficient, a step of acquiring an estimate of the parameter for each of the combinations of the light injection position with the light detection positions, a step of computing a weight function in each voxel, based on the Microscopic Beer-Lambert Law, a step of computing a deviation of the absorption coefficient in each voxel, based on the measurement value and estimate of the parameter, and the weight function, and a step of computing an absolute value of the absorption coefficient in each voxel.