The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2002

Filed:

Aug. 26, 1999
Applicant:
Inventors:

Shuichiro Ogawa, Fuji, JP;

Isao Morimoto, Fuji, JP;

Kazuhiro Nishimura, Fuji, JP;

Masato Terada, Fuji, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 3/02 ;
U.S. Cl.
CPC ...
B32B 3/02 ;
Abstract

A phase change optical disk having a reflectance relation of Rc<Ra and is adapted such that high recording characteristic can be obtained starting at a first recording time even when a recording operation is carried out without conducting an initialization process. For this purpose, a multiple reflection layer ( ), a first dielectric layer ( ), a recording layer ( ), a second dielectric layer ( ), a reflecting layer ( ) and an UV curable resin layer ( ) are provided on a substrate ( ). The recording layer ( ) is deposited at a temperature of the substrate during the deposition of the recording layer set to a temperature which makes the recording layer into a stable amorphous conditions and which is lower than a crystallizing temperature of the recording layer. Thus, the recording layer ( ) is deposited into a stable amorphous state.


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