The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2001
Filed:
Jun. 02, 1998
Birsen Yazici, Clifton Park, NY (US);
Wen-Tai Lin, Niskayuna, NY (US);
Jerome Johnson Tiemann, Schenectady, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method for removing “grid line artifacts” from x-ray images without changing the diagnostic quality of the x-ray image is presented. The method utilizes the Fourier spectrum of the image to detect the grid line frequencies and employs spectral domain filtering to remove the grid line spectral components. The diagnostic information is preserved by modifying the grid line spectral components to be indistinguishable from local variations in image intensity values, and edge density of the x-ray image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile