The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2001
Filed:
Mar. 02, 1998
Yoshihiro Nishikawa, Kobe, JP;
Minolta Co., Ltd., Osaka, JP;
Abstract
An apparatus for measuring a profile of an electron beam of a CRT includes a test pattern generator which generates a test pattern having a plurality of separate luminous images on a fluorescent surface of the CRT, and an image pickup device which picks up the plurality of separate luminous images in a single pickup operation. Positions of phosphors defining one luminous image are made to be relatively different from those of phosphors defining another luminous image. The apparatus is provided with a relative position calculator for calculating respective relative positions of phosphors defining each luminous image, and a beam profile calculator for calculating a profile of an electron beam of the CRT based on outputted pixel data and calculated relative positions.