The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2001

Filed:

Oct. 30, 2000
Applicant:
Inventors:

Jorge L. Acosta, Eugene, OR (US);

Robert W. Rudeen, Eugene, OR (US);

Assignee:

PSC Scanning, Inc., Eugene, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 ;
U.S. Cl.
CPC ...
G06K 7/10 ;
Abstract

A system for and a method of optical scanning which provide for converting between a multiple beam and a single beam optical scanner. In a preferred configuration, the scanner can be adapted to operate as either a single beam scanning system or a multiple beam scanning system. Light sources, mirrors, detectors, collection lenses, and other scanner components are added, removed, and/or replaced, thereby allowing the user to avoid having to purchase a new scanner when the user's performance requirements and/or cost restrictions vary.


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Acosta, Jorge. (2001). System and method for converting multiple beam optical scanner (U.S. Patent No. 6332577). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6332577

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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