The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2001

Filed:

Nov. 18, 1997
Applicant:
Inventors:

Hitoshi Tanaka, Kawasaki, JP;

Masao Kobori, Kawasaki, JP;

Ikuko Tachibana, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/100 ;
U.S. Cl.
CPC ...
G06F 1/100 ;
Abstract

By means of a power-saving function in the information processing device to be tested, the motor in the HDD (Hard Disk Drive) is stopped by the testing program, when the information processing device is transported. Thus, the read/write head in the HDD is automatically set to a safe position.


Find Patent Forward Citations

Tanaka, Hitoshi. (2001). Testing apparatus and method for preventing a disk unit from being damaged (U.S. Patent No. 6332203). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6332203

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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