The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2001
Filed:
Oct. 15, 1999
Evan D. H. Green, San Jose, CA (US);
New Focus, Inc., San Jose, CA (US);
Abstract
An interferometer and related methods for wavelength monitoring are disclosed. The interferometer may be used for the wavelength monitoring or as part of a wavelength feedback and control circuit for an optical signal source. The device operates by creating an output beam on which constructive and destructive optical interference may be detected. The optical interference is generated by a monochromatic beam split into a first beam traversing a stationary path and a second beam traversing a path of variable length. The first and second beams are then recombined to create constructive/destructive interference which may be measured by a detector and correlated with a processor to determine the output wavelength of the optical source. The maximum and minimum of the variable path length are precisely controlled due to use of a micro-positionable semiconductor retroreflector or mirror. Using the known oscillations of the retroreflector measured along the path of the second beam, the wavelength of optical signal source can be precisely and repetitively determined during each oscillation of the retroreflector.