The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2001
Filed:
Jun. 21, 2000
Method for optically inspecting an intermediate layer of an at-least three-layer, large-area article
Ansgar Kaupp, Ahrensburg, DE;
Basler AG, Ahrensburg, DE;
Abstract
A method for the inspection of an article which has a relatively large surface-area and which has at least two opposing, partially transparent, outer layers and at least one intermediate layer located between the outer layers. In particular, the method is utilized to optically inspect optical data media, for instance, DVDs, having the above referenced multilayer structure. The opposing sides of the article are sensed with at least two optical receivers, and the data of the recorded image points of the one optical receiver is allocated to the data of the recorded image points of the other optical receiver in such a manner that the data of the opposing points of the article are allocated to each other and can be evaluated. An identification of a potential error in the intermediate layer is possible when the data of the opposing image points indicate an error in the case of both optical receivers.