The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 18, 2001

Filed:

Mar. 23, 1998
Applicant:
Inventors:

Stanley A. White, San Clemente, CA (US);

Kenneth S. Walley, Portola Hills, CA (US);

James W. Johnston, Santa Margarita, CA (US);

P. Michael Henderson, Tustin, CA (US);

Kelly H. Hale, Aliso Viejo, CA (US);

Warner B. Andrews, Jr., Boulder, CO (US);

Jonathan I. Siann, San Diego, CA (US);

Assignee:

Conexant Systems, Inc., Newport Beach, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 3/128 ; G01R 3/1303 ;
U.S. Cl.
CPC ...
G01R 3/128 ; G01R 3/1303 ;
Abstract

A system for testing a microelectronic circuit includes a test bed for mounting a microelectronic circuit, and a signal source for applying a signal to a microelectronic circuit mounted on the test bed. The system additionally includes a test probe for wirelessly receiving electromagnetic response signals from the microelectronic circuit mounted on the test bed. In a preferred form, the electromagnetic response signals are radio-frequency signals. The test system additionally includes a computer connected to be test probe for analyzing the electromagnetic response signals. An integrated circuit for testing on the test system has a test circuit portion that emits electromagnetic radiation in response to a predetermined signal applied to the test circuit.


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