The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2001
Filed:
Nov. 19, 1999
Paul A. Johnson, Santa Fe, NM (US);
James A. TenCate, Los Alamos, NM (US);
Robert A. Guyer, Amherst, MA (US);
Koen E. A. Van Den Abeele, Sint-Niklaas, BE;
The Regents of the University of California, Los Alamos, NM (US);
Abstract
Components with defects are identified from the response to strains applied at acoustic and ultrasound frequencies. The relative resonance frequency shift |&Dgr;ƒ/ƒ,|, is determined as a function of applied strain amplitude for an acceptable component, where ƒ,is the frequency of the resonance peak at the lowest amplitude of applied strain and &Dgr;ƒ is the frequency shift of the resonance peak of a selected mode to determine a reference relationship. Then, the relative resonance frequency shift |&Dgr;ƒ/ƒ,is determined as a function of applied strain for a component under test, where fo ƒ,the frequency of the resonance peak at the lowest amplitude of applied strain and &Dgr;ƒ is the frequency shift of the resonance peak to determine a quality test relationship. The reference relationship is compared with the quality test relationship to determine the presence of defects in the component under test.