The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2001
Filed:
Feb. 18, 2000
Applicant:
Inventors:
Dorothy A. Erie, Pittsboro, NC (US);
Glenn Ratcliff, Mebane, NC (US);
Richard Superfine, Chapel Hill, NC (US);
Assignee:
The University of North Carolina at Chapel Hill, Chapel Hill, NC (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/28 ; H01J 3/7252 ;
U.S. Cl.
CPC ...
G01B 5/28 ; H01J 3/7252 ;
Abstract
A method of imaging a sample present in a solution by employing an atomic force microscope comprises providing an atomic force microscope having a cantilever that is under the solution, contacting the cantilever with energy to cause the cantilever to bend and vibrate, and detecting the amplitude of vibration of the cantilever from the energy. The cantilever has at least one coating present thereon to absorb energy such that the cantilever bends and vibrates.